Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images

This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images...

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Bibliographic Details
Main Author:	Zhang, Yilu.
Other Authors:	Guo, Ningqun
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Manufacturing
Online Access:	http://hdl.handle.net/10356/5541
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-5541
record_format	dspace
spelling	sg-ntu-dr.10356-55412023-03-11T17:22:51Z Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images Zhang, Yilu. Guo, Ningqun School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images and are compared with the results obtained with classical operators in normal and speckle noise conditions. Then two ways to obtain the size and location of defects are obtained by using blob-coloring to process the map obtained by the Variational method. Master of Engineering (MPE) 2008-09-17T10:53:02Z 2008-09-17T10:53:02Z 2003 2003 Thesis http://hdl.handle.net/10356/5541 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Manufacturing
spellingShingle	DRNTU::Engineering::Manufacturing Zhang, Yilu. Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
description	This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images and are compared with the results obtained with classical operators in normal and speckle noise conditions. Then two ways to obtain the size and location of defects are obtained by using blob-coloring to process the map obtained by the Variational method.
author2	Guo, Ningqun
author_facet	Guo, Ningqun Zhang, Yilu.
format	Theses and Dissertations
author	Zhang, Yilu.
author_sort	Zhang, Yilu.
title	Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
title_short	Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
title_full	Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
title_fullStr	Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
title_full_unstemmed	Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
title_sort	applications of automated defects recognition in ic packaging based on ultrasound c-sam images
publishDate	2008
url	http://hdl.handle.net/10356/5541
_version_	1761781403381399552

Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images

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