Development and characterization of PZT thin films

Fabrication processes and testing of the completed devices were carried out at NTU Micro-Machine Center. X-ray diffraction analysis and the Polarisation-Field (P-E hysteresis loops) of PZT thin film were measured to characterize the film quality and the electrical properties. The process to fabricat...

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Bibliographic Details
Main Author: Zhou, Min.
Other Authors: Miao, Jianmin
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5574
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Institution: Nanyang Technological University
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