Failure analysis of hard disk drive components
A new electrical tagging pattern, which applies a non-return-to zero scheme to directly translate the channel bits to magnetic transitions during the writing of the magnetic pattern around the defect is used. With the help of Kerr magneto-effect, the defective sector is effectively located for furth...
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| Format: | Theses and Dissertations |
| Published: |
2008
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| Online Access: | http://hdl.handle.net/10356/5737 |
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| Institution: | Nanyang Technological University |
| Summary: | A new electrical tagging pattern, which applies a non-return-to zero scheme to directly translate the channel bits to magnetic transitions during the writing of the magnetic pattern around the defect is used. With the help of Kerr magneto-effect, the defective sector is effectively located for further failure analysis. This phenomenon involves an input plane-polarised light. |
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