Failure analysis of hard disk drive components

A new electrical tagging pattern, which applies a non-return-to zero scheme to directly translate the channel bits to magnetic transitions during the writing of the magnetic pattern around the defect is used. With the help of Kerr magneto-effect, the defective sector is effectively located for furth...

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Bibliographic Details
Main Author:	Gee, Sheng Hin.
Other Authors:	Zhong, Zhaowei
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Manufacturing
Online Access:	http://hdl.handle.net/10356/5737
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-5737
record_format	dspace
spelling	sg-ntu-dr.10356-57372023-03-11T17:08:58Z Failure analysis of hard disk drive components Gee, Sheng Hin. Zhong, Zhaowei School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing A new electrical tagging pattern, which applies a non-return-to zero scheme to directly translate the channel bits to magnetic transitions during the writing of the magnetic pattern around the defect is used. With the help of Kerr magneto-effect, the defective sector is effectively located for further failure analysis. This phenomenon involves an input plane-polarised light. Master of Science (Precision Engineering) 2008-09-17T10:57:50Z 2008-09-17T10:57:50Z 2003 2003 Thesis http://hdl.handle.net/10356/5737 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Manufacturing
spellingShingle	DRNTU::Engineering::Manufacturing Gee, Sheng Hin. Failure analysis of hard disk drive components
description	A new electrical tagging pattern, which applies a non-return-to zero scheme to directly translate the channel bits to magnetic transitions during the writing of the magnetic pattern around the defect is used. With the help of Kerr magneto-effect, the defective sector is effectively located for further failure analysis. This phenomenon involves an input plane-polarised light.
author2	Zhong, Zhaowei
author_facet	Zhong, Zhaowei Gee, Sheng Hin.
format	Theses and Dissertations
author	Gee, Sheng Hin.
author_sort	Gee, Sheng Hin.
title	Failure analysis of hard disk drive components
title_short	Failure analysis of hard disk drive components
title_full	Failure analysis of hard disk drive components
title_fullStr	Failure analysis of hard disk drive components
title_full_unstemmed	Failure analysis of hard disk drive components
title_sort	failure analysis of hard disk drive components
publishDate	2008
url	http://hdl.handle.net/10356/5737
_version_	1761781365081112576

Failure analysis of hard disk drive components

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