To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
This reports covers the basic concepts and methodologies of some non destructive testing (NDT) on a very thin layer of flexible micro-circuit, of polyimide base, used in electronic industry.
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| Format: | Theses and Dissertations |
| Published: |
2008
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| Online Access: | http://hdl.handle.net/10356/5939 |
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| Institution: | Nanyang Technological University |