To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit

This reports covers the basic concepts and methodologies of some non destructive testing (NDT) on a very thin layer of flexible micro-circuit, of polyimide base, used in electronic industry.

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Bibliographic Details
Main Author:	Lee, Gee Kean.
Other Authors:	Wong, Brian Stephen
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Mechanical engineering::Mechatronics
Online Access:	http://hdl.handle.net/10356/5939
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-5939
record_format	dspace
spelling	sg-ntu-dr.10356-59392023-03-11T17:14:29Z To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit Lee, Gee Kean. Wong, Brian Stephen School of Mechanical and Production Engineering DRNTU::Engineering::Mechanical engineering::Mechatronics This reports covers the basic concepts and methodologies of some non destructive testing (NDT) on a very thin layer of flexible micro-circuit, of polyimide base, used in electronic industry. Master of Science (Mechanics & Processing of Materials) 2008-09-17T11:02:49Z 2008-09-17T11:02:49Z 2001 2001 Thesis http://hdl.handle.net/10356/5939 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Mechanical engineering::Mechatronics
spellingShingle	DRNTU::Engineering::Mechanical engineering::Mechatronics Lee, Gee Kean. To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
description	This reports covers the basic concepts and methodologies of some non destructive testing (NDT) on a very thin layer of flexible micro-circuit, of polyimide base, used in electronic industry.
author2	Wong, Brian Stephen
author_facet	Wong, Brian Stephen Lee, Gee Kean.
format	Theses and Dissertations
author	Lee, Gee Kean.
author_sort	Lee, Gee Kean.
title	To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
title_short	To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
title_full	To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
title_fullStr	To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
title_full_unstemmed	To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
title_sort	to compare and evaluate various non destructive testing (ndt) methods on microelectronics - flexible microcircuit
publishDate	2008
url	http://hdl.handle.net/10356/5939
_version_	1761781209837338624

To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit

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