Development of sharp and high aspect ratio atomic force microscope probe tip

This project designed AFM probe tips to minimise errors, along with methods of micromachining them.

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Bibliographic Details
Main Author: Lim, Boon Hong.
Other Authors: Ngoi, Bryan Kok Ann
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5998
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Institution: Nanyang Technological University