Development of sharp and high aspect ratio atomic force microscope probe tip

This project designed AFM probe tips to minimise errors, along with methods of micromachining them.

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Bibliographic Details
Main Author:	Lim, Boon Hong.
Other Authors:	Ngoi, Bryan Kok Ann
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Manufacturing::Metrology
Online Access:	http://hdl.handle.net/10356/5998
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-5998
record_format	dspace
spelling	sg-ntu-dr.10356-59982023-03-11T16:55:54Z Development of sharp and high aspect ratio atomic force microscope probe tip Lim, Boon Hong. Ngoi, Bryan Kok Ann School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing::Metrology This project designed AFM probe tips to minimise errors, along with methods of micromachining them. Master of Engineering (MPE) 2008-09-17T11:04:29Z 2008-09-17T11:04:29Z 2001 2001 Thesis http://hdl.handle.net/10356/5998 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Manufacturing::Metrology
spellingShingle	DRNTU::Engineering::Manufacturing::Metrology Lim, Boon Hong. Development of sharp and high aspect ratio atomic force microscope probe tip
description	This project designed AFM probe tips to minimise errors, along with methods of micromachining them.
author2	Ngoi, Bryan Kok Ann
author_facet	Ngoi, Bryan Kok Ann Lim, Boon Hong.
format	Theses and Dissertations
author	Lim, Boon Hong.
author_sort	Lim, Boon Hong.
title	Development of sharp and high aspect ratio atomic force microscope probe tip
title_short	Development of sharp and high aspect ratio atomic force microscope probe tip
title_full	Development of sharp and high aspect ratio atomic force microscope probe tip
title_fullStr	Development of sharp and high aspect ratio atomic force microscope probe tip
title_full_unstemmed	Development of sharp and high aspect ratio atomic force microscope probe tip
title_sort	development of sharp and high aspect ratio atomic force microscope probe tip
publishDate	2008
url	http://hdl.handle.net/10356/5998
_version_	1761781480827125760

Development of sharp and high aspect ratio atomic force microscope probe tip

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