Material characterization of AlGaN/GaN based HEMT structures

Group–III nitride semiconductors are viewed as the next-gen materials due to the high potential in optoelectronic and microelectronic applications. This is based on nitrides having properties such as high mobility and high velocity of the electron-carriers. HEMTs (high electron mobility transistors)...

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Bibliographic Details
Main Author: Nur Hidayat Bin Hatwi
Other Authors: K Radhakrishnan
Format: Final Year Project
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/60792
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Institution: Nanyang Technological University
Language: English
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