Reliability study of high brightness leds under high frequency switching current and thermal cycling condition
With the development in Visible Light Communication (VLC), and LED is a key component in that system, study the reliability of LED under power cycling and thermal cycling becomes a popular project around the world. In this project, by understanding and summarizing lots of previous researches in L...
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sg-ntu-dr.10356-614252023-07-07T15:52:47Z Reliability study of high brightness leds under high frequency switching current and thermal cycling condition Wang, Kai Tan Cher Ming School of Electrical and Electronic Engineering DRNTU::Engineering With the development in Visible Light Communication (VLC), and LED is a key component in that system, study the reliability of LED under power cycling and thermal cycling becomes a popular project around the world. In this project, by understanding and summarizing lots of previous researches in LED reliability, a re-designed circuit is used for testing the optical output of LED under power and thermal cycling. After comparing the data with previous studies, switching frequency seems to be an important coefficient in LED degradation, especially the chip, and lots of data shows thermal cycling can accelerate the degradation of whole package. Bachelor of Engineering 2014-06-10T04:09:31Z 2014-06-10T04:09:31Z 2014 2014 Final Year Project (FYP) http://hdl.handle.net/10356/61425 en Nanyang Technological University 49 p. application/pdf |
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DRNTU::Engineering Wang, Kai Reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| description |
With the development in Visible Light Communication (VLC), and LED is a key component in that system, study the reliability of LED under power cycling and thermal cycling becomes a popular project around the world.
In this project, by understanding and summarizing lots of previous researches in LED reliability, a re-designed circuit is used for testing the optical output of LED under power and thermal cycling.
After comparing the data with previous studies, switching frequency seems to be an important coefficient in LED degradation, especially the chip, and lots of data shows thermal cycling can accelerate the degradation of whole package. |
| author2 |
Tan Cher Ming |
| author_facet |
Tan Cher Ming Wang, Kai |
| format |
Final Year Project |
| author |
Wang, Kai |
| author_sort |
Wang, Kai |
| title |
Reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| title_short |
Reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| title_full |
Reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| title_fullStr |
Reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| title_full_unstemmed |
Reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| title_sort |
reliability study of high brightness leds under high frequency switching current and thermal cycling condition |
| publishDate |
2014 |
| url |
http://hdl.handle.net/10356/61425 |
| _version_ |
1772825914125582336 |