Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test

• Main Authors: Chen, Sihan Joseph, Tan, Cher Ming, Chen, Eric Boon Khai, Chua, Shaun Zhi Yong
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2013
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• 在線閱讀: https://hdl.handle.net/10356/97941; http://hdl.handle.net/10220/11227
• 機構: Nanyang Technological University

In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements...