Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test

Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test

In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements...

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Bibliographic Details
Main Authors: Chen, Sihan Joseph, Tan, Cher Ming, Chen, Eric Boon Khai, Chua, Shaun Zhi Yong
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2013
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Online Access:https://hdl.handle.net/10356/97941
http://hdl.handle.net/10220/11227
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Institution: Nanyang Technological University
Language: English
Description
Summary:In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements artifact arising from DC biasing and PWM settings were first presented. Electrical measurements consistency was then studied. Optimized setting for accurate measurement is obtained using Response Surface Method with Central Composite Design, and the setting is verified through experiments.

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