Precision machining with a vibration device

This dissertation studies grinding of single-crystal Si with a vibration device. Si samples were cut from (100) silicon wafer. The vibration device was employed to hold the sample. The device was placed on the grinding machine table. The grinding direction is parallel to [110] direction of (100) sil...

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Main Author: Rui, Zhao Ya.
Other Authors: Zhong, Zhaowei
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/6338
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-63382023-03-11T17:10:09Z Precision machining with a vibration device Rui, Zhao Ya. Zhong, Zhaowei School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing This dissertation studies grinding of single-crystal Si with a vibration device. Si samples were cut from (100) silicon wafer. The vibration device was employed to hold the sample. The device was placed on the grinding machine table. The grinding direction is parallel to [110] direction of (100) silicon. These samples were subjected to grinding with different vibration directions, frequencies and amplitudes under the same experimental conditions. The surface roughness and the surface texture of all samples were analyzed. Samples ground with vibrations showed better surface roughness values on the silicon surfaces, compared with surfaces ground without vibrations. Master of Science (Precision Engineering) 2008-09-17T11:12:21Z 2008-09-17T11:12:21Z 2004 2004 Thesis http://hdl.handle.net/10356/6338 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Manufacturing
spellingShingle DRNTU::Engineering::Manufacturing
Rui, Zhao Ya.
Precision machining with a vibration device
description This dissertation studies grinding of single-crystal Si with a vibration device. Si samples were cut from (100) silicon wafer. The vibration device was employed to hold the sample. The device was placed on the grinding machine table. The grinding direction is parallel to [110] direction of (100) silicon. These samples were subjected to grinding with different vibration directions, frequencies and amplitudes under the same experimental conditions. The surface roughness and the surface texture of all samples were analyzed. Samples ground with vibrations showed better surface roughness values on the silicon surfaces, compared with surfaces ground without vibrations.
author2 Zhong, Zhaowei
author_facet Zhong, Zhaowei
Rui, Zhao Ya.
format Theses and Dissertations
author Rui, Zhao Ya.
author_sort Rui, Zhao Ya.
title Precision machining with a vibration device
title_short Precision machining with a vibration device
title_full Precision machining with a vibration device
title_fullStr Precision machining with a vibration device
title_full_unstemmed Precision machining with a vibration device
title_sort precision machining with a vibration device
publishDate 2008
url http://hdl.handle.net/10356/6338
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