Radiation hardened ICs

This final year project develops a new Radiation-Hardened-By-Design approach to detect Single Event Latchup (SEL) by monitoring the transient current slope, which is proven with reliable immunity to SEL. The object is to reduce the cost of Radiation-Hardened-By-Process technique by benefiting from t...

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Bibliographic Details
Main Author: Ding, Xiangbin
Other Authors: Chang, Joseph Sylvester
Format: Final Year Project
Language:English
Published: 2015
Subjects:
Online Access:http://hdl.handle.net/10356/64405
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Institution: Nanyang Technological University
Language: English