Interface and domain engineering for enhanced reliability in ferroelectric-based memory

In a ferroelectric random access memory (FeRAM), the two logic states, “1” and “0”, are represented by the spontaneous polarization directions in the ferroelectric material, which can be altered by an external electric field. FeRAM has many advantages, such as high speed and excellent data retention...

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Bibliographic Details
Main Author: Zhou, Yang
Other Authors: Wang Junling
Format: Theses and Dissertations
Language:English
Published: 2016
Subjects:
Online Access:https://hdl.handle.net/10356/65920
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Institution: Nanyang Technological University
Language: English