Structural and electrical characterization of GaN based HEMT heterostructures on SiC

Group III-nitride semiconductors and its alloys has been the subject of intense research because of its wide range of applications in the field of microelectronics and optoelectronics. They are used in light emitting diodes, lasers, detectors, next generation wireless network base stations, satel...

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Bibliographic Details
Main Author: Protik Parvez Sheikh
Other Authors: K Radhakrishnan
Format: Theses and Dissertations
Language:English
Published: 2017
Subjects:
Online Access:http://hdl.handle.net/10356/72586
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Institution: Nanyang Technological University
Language: English
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