Characterisation of an electronic speckle pattern interferometry with active wavefronts
Electronic-Speckle-Pattern-Interferometry (ESPI) is a versatile technique for shape measurements of rough surfaces. The ESPI is limited by two effects: the diffraction on sharp edges and the 2π-modulo-periodicity based on the interferometric principle. Thus, this method is restricted to smooth surfa...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Theses and Dissertations |
| Language: | English |
| Published: |
2018
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/73102 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Nanyang Technological University |
| Language: | English |