Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces

Optical metrology has been widely employed as a key technique for modern industrial production, owing to its fast, precise and non-invasive measurement. Digital speckle pattern interferometry (DSPI) is one of these non-destructive testing methods that possess the abilities to measure surface deforma...

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Bibliographic Details
Main Authors: Matham, Murukeshan Vadakke, Chan, Kelvin H. K., Song, Chaolong
Other Authors: Asundi, Anand K.
Format: Conference or Workshop Item
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/89491
http://hdl.handle.net/10220/47089
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Institution: Nanyang Technological University
Language: English