Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces
Optical metrology has been widely employed as a key technique for modern industrial production, owing to its fast, precise and non-invasive measurement. Digital speckle pattern interferometry (DSPI) is one of these non-destructive testing methods that possess the abilities to measure surface deforma...
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Main Authors: | Matham, Murukeshan Vadakke, Chan, Kelvin H. K., Song, Chaolong |
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Other Authors: | Asundi, Anand K. |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2018
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/89491 http://hdl.handle.net/10220/47089 |
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Institution: | Nanyang Technological University |
Language: | English |
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