Warpage measurement using projection speckle correlation method and microscopic interferometry

10.1117/12.839252

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Bibliographic Details
Main Authors: Sun, W., He, X.Y., Quan, C.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/74012
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Institution: National University of Singapore