Design of variation-tolerant integrated circuits

The semiconductor industry is strategically focusing on automotive markets and significant investment is targeted to address these markets. Run time better-than-worst-case designs like Razor leads to massive timing errors upon breaching the critical operating point and have significant area overhead...

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Main Author: Jayakrishnan, Mini
Other Authors: Kim Tae Hyoung
Format: Theses and Dissertations
Language:English
Published: 2018
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Online Access:http://hdl.handle.net/10356/73872
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-738722023-07-04T17:32:54Z Design of variation-tolerant integrated circuits Jayakrishnan, Mini Kim Tae Hyoung School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits The semiconductor industry is strategically focusing on automotive markets and significant investment is targeted to address these markets. Run time better-than-worst-case designs like Razor leads to massive timing errors upon breaching the critical operating point and have significant area overheads. As we scale to higher-reliability automotive and industrial markets we need alternative techniques that will allow full extraction of the power benefits without sacrificing reliability. In this work, we propose four resilient processor subsystems which incorporate slack balancing circuits to relax the timing margins of a processor pipeline based on the available slack. Together with logic under-design, the proposed methodology results in power and area savings compared to worst-case design techniques. The presence of slack balancing circuits ensures correct functionality of the design at worst operating conditions. Based on this, we propose the first subsystem to utilize positive slack available in the pipeline stages using Slack Balancing Flip-flops (SBFFs) and re-distributes it to the preceding error-prone critical paths. SBFF has a redundant latch to sample the late arriving data. We reshape the SBFF fan-in cone by downsizing the logic to achieve power and area savings of 12% and 8%, respectively, as compared to the worst-case design. Our second subsystem uses library based power optimization techniques together with SBFFs. Here we prune the SBFF standard cell library to filter out the power-hungry cells. In addition to this, we use Better than Worst-case (BTWC) sigma corner library to under-design the logic whose slack margins are relaxed by the SBFFs. This gave a power and area savings of 47% and 3%, respectively, in the execute pipeline stage. The third subsystem provides a Clock Stretching Flip-flop (CSFF) to remove the redundancy inside SBFFs for better power and area savings. The combination of CSFFs, multi-bit flip-flops (MBFFs), logic reshaping and BTWC sigma corner libraries resulted in a power and area savings of 32% and 16%, respectively, in the fetch pipeline stage and 69% and 15%, respectively, in the execute pipeline stage when compared to the traditional worst-case design. In the fourth subsystem, we use Data-dependent Clock Stretching Flip-flop (DDCSFF) in addition to simple CSFFs to replace the critical endpoints with sufficiently low activity rates. Here we use logic reshaping for power optimization together with CSFFs and DDCSFFs. Experiment results showed power and area savings of 70% and 9.5%, respectively, in the execute pipeline stage with respect to the worst-case design. For all the proposed subsystems, the critical logic power minimization method relaxes the slack margins of all the timing paths including the short paths converging into the SBFF. The timing budgeting and timing correction using opportunistic slack eliminates critical operating point behaviour, meta-stability issues and hold buffer overheads encountered in existing resilience techniques. Doctor of Philosophy (EEE) 2018-04-17T08:43:19Z 2018-04-17T08:43:19Z 2018 Thesis Jayakrishnan, M. (2018). Design of variation-tolerant integrated circuits. Doctoral thesis, Nanyang Technological University, Singapore. http://hdl.handle.net/10356/73872 10.32657/10356/73872 en 105 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Jayakrishnan, Mini
Design of variation-tolerant integrated circuits
description The semiconductor industry is strategically focusing on automotive markets and significant investment is targeted to address these markets. Run time better-than-worst-case designs like Razor leads to massive timing errors upon breaching the critical operating point and have significant area overheads. As we scale to higher-reliability automotive and industrial markets we need alternative techniques that will allow full extraction of the power benefits without sacrificing reliability. In this work, we propose four resilient processor subsystems which incorporate slack balancing circuits to relax the timing margins of a processor pipeline based on the available slack. Together with logic under-design, the proposed methodology results in power and area savings compared to worst-case design techniques. The presence of slack balancing circuits ensures correct functionality of the design at worst operating conditions. Based on this, we propose the first subsystem to utilize positive slack available in the pipeline stages using Slack Balancing Flip-flops (SBFFs) and re-distributes it to the preceding error-prone critical paths. SBFF has a redundant latch to sample the late arriving data. We reshape the SBFF fan-in cone by downsizing the logic to achieve power and area savings of 12% and 8%, respectively, as compared to the worst-case design. Our second subsystem uses library based power optimization techniques together with SBFFs. Here we prune the SBFF standard cell library to filter out the power-hungry cells. In addition to this, we use Better than Worst-case (BTWC) sigma corner library to under-design the logic whose slack margins are relaxed by the SBFFs. This gave a power and area savings of 47% and 3%, respectively, in the execute pipeline stage. The third subsystem provides a Clock Stretching Flip-flop (CSFF) to remove the redundancy inside SBFFs for better power and area savings. The combination of CSFFs, multi-bit flip-flops (MBFFs), logic reshaping and BTWC sigma corner libraries resulted in a power and area savings of 32% and 16%, respectively, in the fetch pipeline stage and 69% and 15%, respectively, in the execute pipeline stage when compared to the traditional worst-case design. In the fourth subsystem, we use Data-dependent Clock Stretching Flip-flop (DDCSFF) in addition to simple CSFFs to replace the critical endpoints with sufficiently low activity rates. Here we use logic reshaping for power optimization together with CSFFs and DDCSFFs. Experiment results showed power and area savings of 70% and 9.5%, respectively, in the execute pipeline stage with respect to the worst-case design. For all the proposed subsystems, the critical logic power minimization method relaxes the slack margins of all the timing paths including the short paths converging into the SBFF. The timing budgeting and timing correction using opportunistic slack eliminates critical operating point behaviour, meta-stability issues and hold buffer overheads encountered in existing resilience techniques.
author2 Kim Tae Hyoung
author_facet Kim Tae Hyoung
Jayakrishnan, Mini
format Theses and Dissertations
author Jayakrishnan, Mini
author_sort Jayakrishnan, Mini
title Design of variation-tolerant integrated circuits
title_short Design of variation-tolerant integrated circuits
title_full Design of variation-tolerant integrated circuits
title_fullStr Design of variation-tolerant integrated circuits
title_full_unstemmed Design of variation-tolerant integrated circuits
title_sort design of variation-tolerant integrated circuits
publishDate 2018
url http://hdl.handle.net/10356/73872
_version_ 1772826679956209664