Analysis and architecting of hierarchical DFT flow
Design for Test (DFT) is a critical activity in the modern System on Chip designs as the complexity of the chip is increasing. Generating test patterns for the current and upcoming devices having huge designs is again becoming a challenge which needs to be addressed. Hierarchical DFT is one such...
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格式: | Theses and Dissertations |
語言: | English |
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2018
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在線閱讀: | http://hdl.handle.net/10356/76064 |
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