Scan implementation and toggle coverage estimation for voice subsystem

With shrinking technology node, the reliability and testability of integrated circuits has become crucial. Larger designs pose greater challenges to various aspects of Chip design including Design for Testability (DFT). DFT techniques are implemented to provide controllability and observability of t...

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Bibliographic Details
Main Author: Mohan, Vivek
Other Authors: Lim Meng Hiot
Format: Theses and Dissertations
Language:English
Published: 2019
Subjects:
Online Access:http://hdl.handle.net/10356/76780
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Institution: Nanyang Technological University
Language: English