Optimization of thermal imaging techniques in failure analysis

• المؤلف الرئيسي: Sidambararajan, Preethy Sudhan
• مؤلفون آخرون: Zhou Xing
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2019
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/76873
• المؤسسة: Nanyang Technological University

Lock-in thermography (LIT) has been gaining more attention from the research community for non-destructive evaluation of integrated circuits (IC) and localization of thermal active electrical defects in microelectronics and circuit reliability research. Thermal imaging is considered to be the standa...