Comprehensive laser sensitivity profiling and data register bit-flips in 65 nm FPGA

• المؤلفون الرئيسيون: He, Wei, Breier, Jakub, Bhasin, Shivam, Jap, Dirmanto, Ong, Hock Guan, Gan, Chee Lip
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2017
• الموضوعات: Cryptographic fault attack; Laser fault injection
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/82156; http://hdl.handle.net/10220/42300
• المؤسسة: Nanyang Technological University

FPGAs have emerged as a popular platform for security sensitive applications. As a practical attack methodology, laser based fault analyses have drawn much attention in the past years due to its superior accuracy in fault perturbation into security-critical Integrated Circuits (ICs). However, due to...