Extensive Laser Fault Injection Profiling of 65 nm FPGA

Fault injection attacks have been widely investigated in both academia and industry during the past decade. In this attack approach, the adversary intentionally induces computational faults in the security components of the integrated circuit (IC) for deducing the confidential information processed...

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Bibliographic Details
Main Authors: Breier, Jakub, He, Wei, Bhasin, Shivam, Jap, Dirmanto, Chef, Samuel, Ong, Hock Guan, Gan, Chee Lip
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/88764
http://hdl.handle.net/10220/44737
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Institution: Nanyang Technological University
Language: English