Extensive Laser Fault Injection Profiling of 65 nm FPGA

• Main Authors: Breier, Jakub, He, Wei, Bhasin, Shivam, Jap, Dirmanto, Chef, Samuel, Ong, Hock Guan, Gan, Chee Lip
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2018
• 主題: Cryptographic Fault Attack; Laser Fault Injection
• 在線閱讀: https://hdl.handle.net/10356/88764; http://hdl.handle.net/10220/44737

Fault injection attacks have been widely investigated in both academia and industry during the past decade. In this attack approach, the adversary intentionally induces computational faults in the security components of the integrated circuit (IC) for deducing the confidential information processed...