Extensive Laser Fault Injection Profiling of 65 nm FPGA

• Main Authors: Breier, Jakub, He, Wei, Bhasin, Shivam, Jap, Dirmanto, Chef, Samuel, Ong, Hock Guan, Gan, Chee Lip
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2018
• Subjects: Cryptographic Fault Attack; Laser Fault Injection
• Online Access: https://hdl.handle.net/10356/88764; http://hdl.handle.net/10220/44737
• Institution: Nanyang Technological University

Fault injection attacks have been widely investigated in both academia and industry during the past decade. In this attack approach, the adversary intentionally induces computational faults in the security components of the integrated circuit (IC) for deducing the confidential information processed...