Comprehensive laser sensitivity profiling and data register bit-flips in 65 nm FPGA

• Main Authors: He, Wei, Breier, Jakub, Bhasin, Shivam, Jap, Dirmanto, Ong, Hock Guan, Gan, Chee Lip
• 其他作者: School of Materials Science & Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2017
• 主題: Cryptographic fault attack; Laser fault injection
• 在線閱讀: https://hdl.handle.net/10356/82156; http://hdl.handle.net/10220/42300

FPGAs have emerged as a popular platform for security sensitive applications. As a practical attack methodology, laser based fault analyses have drawn much attention in the past years due to its superior accuracy in fault perturbation into security-critical Integrated Circuits (ICs). However, due to...