PLL to the Rescue: A Novel EM Fault Countermeasure

• Main Authors: Miura, Noriyuki, Najm, Zakaria, He, Wei, Bhasin, Shivam, Ngo, Xuan Thuy, Nagata, Makoto, Danger, Jean-Luc
• 其他作者: Proceedings of the 53rd Annual Design Automation Conference (DAC 2016)
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2016
• 主題: Fault Attacks; Electromagnetic Attacks
• 在線閱讀: https://hdl.handle.net/10356/83379; http://hdl.handle.net/10220/41437
• 機構: Nanyang Technological University

Electromagnetic injection (EMI) is a powerful and precise technique for fault injection in modern ICs. This intentional fault can be utilized to steal secret information hidden inside of ICs. Unlike laser fault injection, tedious package decapsulation is not needed for EMI, which reduces an attacker...