An Epitaxial Ferroelectric Tunnel Junction on Silicon

Epitaxially grown functional perovskites on silicon (001) and the ferroelectricity of a 3.2 nm thick BaTiO3 barrier layer are demonstrated. The polarization-switching-induced change in tunneling resistance is measured to be two orders of magnitude. The obtained results suggest the possibility of int...

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Main Authors: Li, Zhipeng, Guo, Xiao, Lu, Hui-Bin, Zhang, Zaoli, Song, Dongsheng, Cheng, Shaobo, Bosman, Michel, Zhu, Jing, Dong, Zhili, Zhu, Weiguang
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2016
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Online Access:https://hdl.handle.net/10356/82373
http://hdl.handle.net/10220/39930
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-823732020-06-01T10:13:31Z An Epitaxial Ferroelectric Tunnel Junction on Silicon Li, Zhipeng Guo, Xiao Lu, Hui-Bin Zhang, Zaoli Song, Dongsheng Cheng, Shaobo Bosman, Michel Zhu, Jing Dong, Zhili Zhu, Weiguang School of Electrical and Electronic Engineering School of Materials Science & Engineering Ferroelectric tunnel junction Non-volatile memory Tunneling electroresistance Epitaxial growth Pulsed laser deposition Epitaxially grown functional perovskites on silicon (001) and the ferroelectricity of a 3.2 nm thick BaTiO3 barrier layer are demonstrated. The polarization-switching-induced change in tunneling resistance is measured to be two orders of magnitude. The obtained results suggest the possibility of integrating ferroelectric tunnel junctions as binary data storage media in non-volatile memory cells on a silicon platform. ASTAR (Agency for Sci., Tech. and Research, S’pore) 2016-02-03T03:08:40Z 2019-12-06T14:54:22Z 2016-02-03T03:08:40Z 2019-12-06T14:54:22Z 2014 Journal Article Li, Z., Guo, X., Lu, H. B., Zhang, Z., Song, D., Cheng, S., Bosman, M., Zhu, J., Dong, Z.,& Zhu, W. (2014). An Epitaxial Ferroelectric Tunnel Junction on Silicon. Advanced Materials, 26(42), 7185-7189. 0935-9648 https://hdl.handle.net/10356/82373 http://hdl.handle.net/10220/39930 10.1002/adma.201402527 en Advanced Materials © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic Ferroelectric tunnel junction
Non-volatile memory
Tunneling electroresistance
Epitaxial growth
Pulsed laser deposition
spellingShingle Ferroelectric tunnel junction
Non-volatile memory
Tunneling electroresistance
Epitaxial growth
Pulsed laser deposition
Li, Zhipeng
Guo, Xiao
Lu, Hui-Bin
Zhang, Zaoli
Song, Dongsheng
Cheng, Shaobo
Bosman, Michel
Zhu, Jing
Dong, Zhili
Zhu, Weiguang
An Epitaxial Ferroelectric Tunnel Junction on Silicon
description Epitaxially grown functional perovskites on silicon (001) and the ferroelectricity of a 3.2 nm thick BaTiO3 barrier layer are demonstrated. The polarization-switching-induced change in tunneling resistance is measured to be two orders of magnitude. The obtained results suggest the possibility of integrating ferroelectric tunnel junctions as binary data storage media in non-volatile memory cells on a silicon platform.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Li, Zhipeng
Guo, Xiao
Lu, Hui-Bin
Zhang, Zaoli
Song, Dongsheng
Cheng, Shaobo
Bosman, Michel
Zhu, Jing
Dong, Zhili
Zhu, Weiguang
format Article
author Li, Zhipeng
Guo, Xiao
Lu, Hui-Bin
Zhang, Zaoli
Song, Dongsheng
Cheng, Shaobo
Bosman, Michel
Zhu, Jing
Dong, Zhili
Zhu, Weiguang
author_sort Li, Zhipeng
title An Epitaxial Ferroelectric Tunnel Junction on Silicon
title_short An Epitaxial Ferroelectric Tunnel Junction on Silicon
title_full An Epitaxial Ferroelectric Tunnel Junction on Silicon
title_fullStr An Epitaxial Ferroelectric Tunnel Junction on Silicon
title_full_unstemmed An Epitaxial Ferroelectric Tunnel Junction on Silicon
title_sort epitaxial ferroelectric tunnel junction on silicon
publishDate 2016
url https://hdl.handle.net/10356/82373
http://hdl.handle.net/10220/39930
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