Quantifying the sources of ionosphere day‐to‐day variability

• Main Authors: Matsuo, Tomoko, Viereck, Rodney, Fang, Tzu‐Wei, Fuller‐Rowell, Tim, Yudin, Valery
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2019
• Subjects: Ionosphere Variability; Whole Atmosphere Modeling; Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/83149; http://hdl.handle.net/10220/49108
• Institution: Nanyang Technological University

Simulations from the coupled Whole Atmosphere Model and Global Ionosphere Plasmasphere show significant day‐to‐day variations in total electron content (TEC) and the F region peak density (NmF2). The Whole Atmosphere Model‐Global Ionosphere Plasmasphere was driven by the auroral precipitation patter...