Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES
Laser fault injection is one of the strongest fault injection techniques. It offers a precise area positioning and a precise timing, allowing a high repeatability of experiments. In our paper we examine possibilities of laser-induced faults that could lead to instruction skips. After the profiling p...
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sg-ntu-dr.10356-833342020-09-26T22:16:09Z Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES Breier, Jakub Jap, Dirmanto Chen, Chien-Ning School of Physical and Mathematical Sciences CPSS 2015 - Proceedings of the 1st ACM Workshop on Cyber-Physical System Security Temasek Laboratories Fault Attack Laser Laser fault injection is one of the strongest fault injection techniques. It offers a precise area positioning and a precise timing, allowing a high repeatability of experiments. In our paper we examine possibilities of laser-induced faults that could lead to instruction skips. After the profiling phase we were able to perform an attack on the last AddRoundKey operation in AES and to retrieve the secret key with just one faulty and correct ciphertext pair. Our experiments show very high degree of repeatability and 100% success rate with correct laser settings. Accepted version 2017-05-30T07:09:13Z 2019-12-06T15:20:11Z 2017-05-30T07:09:13Z 2019-12-06T15:20:11Z 2015 Conference Paper Breier, J., Jap, D., & Chen, C.-N. (2015). Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES. CPSS 2015 - Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, 99-103. https://hdl.handle.net/10356/83334 http://hdl.handle.net/10220/42519 10.1145/2732198.2732206 en © 2015 Association for Computing Machinery (ACM). This is the author created version of a work that has been peer reviewed and accepted for publication by CPSS 2015 - Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, Association for Computing Machinery (ACM). It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1145/2732198.2732206]. 10 p. application/pdf |
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Fault Attack Laser Breier, Jakub Jap, Dirmanto Chen, Chien-Ning Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES |
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Laser fault injection is one of the strongest fault injection techniques. It offers a precise area positioning and a precise timing, allowing a high repeatability of experiments. In our paper we examine possibilities of laser-induced faults that could lead to instruction skips. After the profiling phase we were able to perform an attack on the last AddRoundKey operation in AES and to retrieve the secret key with just one faulty and correct ciphertext pair. Our experiments show very high degree of repeatability and 100% success rate with correct laser settings. |
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School of Physical and Mathematical Sciences |
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School of Physical and Mathematical Sciences Breier, Jakub Jap, Dirmanto Chen, Chien-Ning |
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Conference or Workshop Item |
author |
Breier, Jakub Jap, Dirmanto Chen, Chien-Ning |
author_sort |
Breier, Jakub |
title |
Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES |
title_short |
Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES |
title_full |
Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES |
title_fullStr |
Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES |
title_full_unstemmed |
Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES |
title_sort |
laser profiling for the back-side fault attacks: with a practical laser skip instruction attack on aes |
publishDate |
2017 |
url |
https://hdl.handle.net/10356/83334 http://hdl.handle.net/10220/42519 |
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1681059122297962496 |