Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES

• Main Authors: Breier, Jakub, Jap, Dirmanto, Chen, Chien-Ning
• 其他作者: School of Physical and Mathematical Sciences
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2017
• 主題: Fault Attack; Laser
• 在線閱讀: https://hdl.handle.net/10356/83334; http://hdl.handle.net/10220/42519
• 機構: Nanyang Technological University

Laser fault injection is one of the strongest fault injection techniques. It offers a precise area positioning and a precise timing, allowing a high repeatability of experiments. In our paper we examine possibilities of laser-induced faults that could lead to instruction skips. After the profiling p...