Hardness of k-LWE and Applications in Traitor Tracing

• Main Authors: Ling, San, Phan, Duong Hieu, Stehlé, Damien, Steinfeld, Ron
• Other Authors: School of Physical and Mathematical Sciences
• Format: Article
• Language: English
• Published: 2017
• Subjects: Lattice-based cryptography; Traitor tracing
• Online Access: https://hdl.handle.net/10356/84074; http://hdl.handle.net/10220/42953
• Institution: Nanyang Technological University

We introduce the k-LWE problem, a Learning With Errors variant of the k-SIS problem. The Boneh-Freeman reduction from SIS to k-SIS suffers from an exponential loss in k. We improve and extend it to an LWE to k-LWE reduction with a polynomial loss in k, by relying on a new technique involving trapdoo...