Localization-driven metal-insulator transition in epitaxial hole-doped Nd 1−x Sr x NiO 3 ultrathin films

Advances in thin film growth technologies make it possible to obtain ultra-thin perovskite oxide films and open the window for controlling novel electronic phases for use in functional nanoscale electronics, such as switches and sensors. Here, we study the thickness-dependent transport characteristi...

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Main Authors: Wang, Le, Chang, Lei, Yin, Xinmao, Rusydi, Andrivo, You, Lu, Zhou, Yang, Fang, Liang, Wang, Junling
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2016
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在線閱讀:https://hdl.handle.net/10356/84695
http://hdl.handle.net/10220/41950
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