The revised m-of-k runs rule based on median run length

• Main Authors: Low, Chun Kit., Khoo, Michael B. C., Teoh, Wei Lin., Wu, Zhang.
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Article
• Language: English
• Published: 2013
• Online Access: https://hdl.handle.net/10356/85389; http://hdl.handle.net/10220/13057
• Institution: Nanyang Technological University

Runs rules are used to increase the sensitivity of the Shewhart X control chart in detecting small and moderate process mean shifts. Most of the X charts incorporating runs rules are designed based on the average run length (ARL). It is known that the shape of the run length distribution change...