The revised m-of-k runs rule based on median run length
Runs rules are used to increase the sensitivity of the Shewhart X control chart in detecting small and moderate process mean shifts. Most of the X charts incorporating runs rules are designed based on the average run length (ARL). It is known that the shape of the run length distribution change...
Saved in:
Main Authors: | Low, Chun Kit., Khoo, Michael B. C., Teoh, Wei Lin., Wu, Zhang. |
---|---|
Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Article |
Language: | English |
Published: |
2013
|
Online Access: | https://hdl.handle.net/10356/85389 http://hdl.handle.net/10220/13057 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Optimal design of the synthetic chart for the process mean based on median run length
by: Khoo, Michael B. C., et al.
Published: (2013) -
Run rules for cusum chart
by: Loh, Teck Hee.
Published: (2008) -
An engineer’s rules for running a business
by: Singapore Management University
Published: (2018) -
Computing average run lengths of exponential EWMA charts
by: Gan, F.F., et al.
Published: (2014) -
Novel Indexing of Cyclic Codes with Run-Length Applications
by: Hai Q. Dinh, et al.
Published: (2020)