The revised m-of-k runs rule based on median run length

Runs rules are used to increase the sensitivity of the Shewhart X control chart in detecting small and moderate process mean shifts. Most of the X charts incorporating runs rules are designed based on the average run length (ARL). It is known that the shape of the run length distribution change...

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Bibliographic Details
Main Authors: Low, Chun Kit., Khoo, Michael B. C., Teoh, Wei Lin., Wu, Zhang.
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/85389
http://hdl.handle.net/10220/13057
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Institution: Nanyang Technological University
Language: English

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