Performance of new signal-to-noise ratio estimation for SEM images based on single image noise cross-correlation

A new technique for estimation of signal-to-noise ratio in scanning electron microscope images is reported. The method is based on the image noise cross-correlation estimation model recently developed. We derive the basic performance limits on a single image signal-to-noise ratio estimation using th...

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Bibliographic Details
Main Authors: LIM, W.K., Nia, M. E., Tso, Chih Ping., Sim, K. S.
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/85648
http://hdl.handle.net/10220/18084
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Institution: Nanyang Technological University
Language: English
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