Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm

Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the fr...

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Main Authors: Agarwal, Krishna, Macháň, Radek, Prasad, Dilip Kumar
Other Authors: School of Computer Science and Engineering
Format: Article
Language:English
Published: 2018
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Online Access:https://hdl.handle.net/10356/87383
http://hdl.handle.net/10220/45392
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-873832020-03-07T11:48:57Z Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm Agarwal, Krishna Macháň, Radek Prasad, Dilip Kumar School of Computer Science and Engineering Localization Microscopy Multiple Signal Classification Algorithm Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the frames, giving same weight to each frame irrespective of its signal-to-noise ratio. This results in a bias towards frames with low signal-to-noise ratio and causes cluttered background in the super-resolved image. User-defined heuristic computational filters are employed to remove a set of localizations in an attempt to overcome this bias. Multiple signal classification performs eigen-decomposition of the entire stack, irrespective of the relative signal-to-noise ratios of the frames, and uses a threshold to classify eigenimages into signal and null subspaces. This results in under-representation of frames with low signal-to-noise ratio in the signal space and over-representation in the null space. Thus, multiple signal classification algorithms is biased against frames with low signal-to-noise ratio resulting into suppression of the corresponding fluorophores. This paper presents techniques to automatically debias localization microscopy and multiple signal classification algorithm of these biases without compromising their resolution and without employing heuristics, user-defined criteria. The effect of debiasing is demonstrated through five datasets of invitro and fixed cell samples. MOE (Min. of Education, S’pore) Published version 2018-07-30T08:29:55Z 2019-12-06T16:40:40Z 2018-07-30T08:29:55Z 2019-12-06T16:40:40Z 2018 Journal Article Agarwal, K., Macháň, R., & Prasad, D. K. (2018). Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm. Scientific Reports, 8(1), 4988-. 2045-2322 https://hdl.handle.net/10356/87383 http://hdl.handle.net/10220/45392 10.1038/s41598-018-23374-7 en Scientific Reports © 2018 The Author(s) (Nature Publishing Group). This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ 14 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic Localization Microscopy
Multiple Signal Classification Algorithm
spellingShingle Localization Microscopy
Multiple Signal Classification Algorithm
Agarwal, Krishna
Macháň, Radek
Prasad, Dilip Kumar
Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
description Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the frames, giving same weight to each frame irrespective of its signal-to-noise ratio. This results in a bias towards frames with low signal-to-noise ratio and causes cluttered background in the super-resolved image. User-defined heuristic computational filters are employed to remove a set of localizations in an attempt to overcome this bias. Multiple signal classification performs eigen-decomposition of the entire stack, irrespective of the relative signal-to-noise ratios of the frames, and uses a threshold to classify eigenimages into signal and null subspaces. This results in under-representation of frames with low signal-to-noise ratio in the signal space and over-representation in the null space. Thus, multiple signal classification algorithms is biased against frames with low signal-to-noise ratio resulting into suppression of the corresponding fluorophores. This paper presents techniques to automatically debias localization microscopy and multiple signal classification algorithm of these biases without compromising their resolution and without employing heuristics, user-defined criteria. The effect of debiasing is demonstrated through five datasets of invitro and fixed cell samples.
author2 School of Computer Science and Engineering
author_facet School of Computer Science and Engineering
Agarwal, Krishna
Macháň, Radek
Prasad, Dilip Kumar
format Article
author Agarwal, Krishna
Macháň, Radek
Prasad, Dilip Kumar
author_sort Agarwal, Krishna
title Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
title_short Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
title_full Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
title_fullStr Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
title_full_unstemmed Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
title_sort non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
publishDate 2018
url https://hdl.handle.net/10356/87383
http://hdl.handle.net/10220/45392
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