Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm

• Main Authors: Agarwal, Krishna, Macháň, Radek, Prasad, Dilip Kumar
• Other Authors: School of Computer Science and Engineering
• Format: Article
• Language: English
• Published: 2018
• Subjects: Localization Microscopy; Multiple Signal Classification Algorithm
• Online Access: https://hdl.handle.net/10356/87383; http://hdl.handle.net/10220/45392
• Institution: Nanyang Technological University

Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the fr...