Surface diffusion-limited lifetime of silver and copper nanofilaments in resistive switching devices

• Main Authors: Wang, Wei, Wang, Ming, Ambrosi, Elia, Bricalli, Alessandro, Laudato, Mario, Sun, Zhong, Chen, Xiaodong, Ielmini, Daniele
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2019
• 主題: DRNTU::Engineering::Materials; Conductive Filament; Resistive Switching
• 在線閱讀: https://hdl.handle.net/10356/88837; http://hdl.handle.net/10220/47637

Silver/copper-filament-based resistive switching memory relies on the formation and disruption of a metallic conductive filament (CF) with relatively large surface-to-volume ratio. The nanoscale CF can spontaneously break after formation, with a lifetime ranging from few microseconds to several mont...