One-stop measurement model for fast and accurate tensor display characterization

Many light field displays are fundamentally different from other displays in that they do not have quantized pixels, quantized angular outputs, or a physical screen position, which can make definitions and characterization problematic. We have determined that it is more appropriate to express the sp...

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Main Authors: Surman, Phil, Wang, Shizheng, Yuan, Junsong, Zheng, Yuanjin
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2019
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Online Access:https://hdl.handle.net/10356/88938
http://hdl.handle.net/10220/48347
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-889382020-03-07T13:57:25Z One-stop measurement model for fast and accurate tensor display characterization Surman, Phil Wang, Shizheng Yuan, Junsong Zheng, Yuanjin School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering Displays Spatial Filtering Many light field displays are fundamentally different from other displays in that they do not have quantized pixels, quantized angular outputs, or a physical screen position, which can make definitions and characterization problematic. We have determined that it is more appropriate to express the spatial resolution in terms of spatial cutoff frequency rather than a physical distance as in the case of a display with actual quantized pixels. This concept is then extended to also encompass angular resolution. The technique exploits the fact that when spatial resolution of a sinusoidal grating pattern is halved, its contrast ratio is reduced by a known proportion. An improved model, based on an earlier design concept, has been developed. It not only can be used to measure spatial and angular cutoff frequencies, but also can enable comprehensive characterization of the display. This model provides fast, simple measurement with good accuracy. It does not use special equipment or require time-consuming subjective evaluations. Using the model to characterize images in a rapid, accurate manner validates the effectiveness of this technique. NRF (Natl Research Foundation, S’pore) Accepted version 2019-05-23T08:21:21Z 2019-12-06T17:14:09Z 2019-05-23T08:21:21Z 2019-12-06T17:14:09Z 2018 Journal Article Surman, P., Wang, S., Yuan, J., & Zheng, Y. (2018). One-stop measurement model for fast and accurate tensor display characterization. Journal of the Optical Society of America A, 35(2), 346-355. doi:10.1364/JOSAA.35.000346 1084-7529 https://hdl.handle.net/10356/88938 http://hdl.handle.net/10220/48347 10.1364/JOSAA.35.000346 en Journal of the Optical Society of America A © 2018 Optical Society of America. All rights reserved. This paper was published in Journal of the Optical Society of America A and is made available with permission of Optical Society of America. 11 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
Displays
Spatial Filtering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Displays
Spatial Filtering
Surman, Phil
Wang, Shizheng
Yuan, Junsong
Zheng, Yuanjin
One-stop measurement model for fast and accurate tensor display characterization
description Many light field displays are fundamentally different from other displays in that they do not have quantized pixels, quantized angular outputs, or a physical screen position, which can make definitions and characterization problematic. We have determined that it is more appropriate to express the spatial resolution in terms of spatial cutoff frequency rather than a physical distance as in the case of a display with actual quantized pixels. This concept is then extended to also encompass angular resolution. The technique exploits the fact that when spatial resolution of a sinusoidal grating pattern is halved, its contrast ratio is reduced by a known proportion. An improved model, based on an earlier design concept, has been developed. It not only can be used to measure spatial and angular cutoff frequencies, but also can enable comprehensive characterization of the display. This model provides fast, simple measurement with good accuracy. It does not use special equipment or require time-consuming subjective evaluations. Using the model to characterize images in a rapid, accurate manner validates the effectiveness of this technique.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Surman, Phil
Wang, Shizheng
Yuan, Junsong
Zheng, Yuanjin
format Article
author Surman, Phil
Wang, Shizheng
Yuan, Junsong
Zheng, Yuanjin
author_sort Surman, Phil
title One-stop measurement model for fast and accurate tensor display characterization
title_short One-stop measurement model for fast and accurate tensor display characterization
title_full One-stop measurement model for fast and accurate tensor display characterization
title_fullStr One-stop measurement model for fast and accurate tensor display characterization
title_full_unstemmed One-stop measurement model for fast and accurate tensor display characterization
title_sort one-stop measurement model for fast and accurate tensor display characterization
publishDate 2019
url https://hdl.handle.net/10356/88938
http://hdl.handle.net/10220/48347
_version_ 1681048092440264704