Application of Wigner–Ville distribution in electromigration noise analysis

• Main Authors: Tan, Cher Ming, Lim, Shin Yeh
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/91224; http://hdl.handle.net/10220/4655
• Institution: Nanyang Technological University

Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex d...