Application of Wigner–Ville distribution in electromigration noise analysis

• المؤلفون الرئيسيون: Tan, Cher Ming, Lim, Shin Yeh
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2009
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/91224; http://hdl.handle.net/10220/4655
• المؤسسة: Nanyang Technological University

Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex d...