Multiple regression models for electronic product success prediction

As the cost of failure in new product development is very high, product developers are looking for good product success/failure prediction models. The general direction of search is towards Knowledge Based Systems (KBS) that incorporate the wisdom of experienced developers and extracts from data of...

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Bibliographic Details
Main Authors: Lo, Frank Cheong Wah, Foo, Say Wei, Bauly, John A.
Other Authors: IEEE International Conference on Management of Innovation and Technology (1st : 2000 : Singapore)
Format: Conference or Workshop Item
Language:English
Published: 2009
Online Access:https://hdl.handle.net/10356/91312
http://hdl.handle.net/10220/4587
http://sfxna09.hosted.exlibrisgroup.com:3410/ntu/sfxlcl3?sid=metalib:EVII&id=doi:10.1109/ICMIT.2000.917374&genre=&isbn=0 7803 6652 2&issn=&date=2000&volume=&issue=&spage=419&epage=22&aulast=Lo&aufirst=%20F%20C%20%2DW&auinit=&title=Proceedings%20of%20the%202000%20IEEE%20International%20Conference%20on%20Management%20of%20Innovation%20and%20Technology%2E%20ICMIT%202000%2E%20%60Management%20in%20the%2021st%20Century%27%20%28Cat%2E%20No%2E00EX457%29&atitle=Multiple%20regression%20models%20for%20electronic%20product%20success%20prediction
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Institution: Nanyang Technological University
Language: English
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