Phase extraction from electronic speckle patterns by statistical analysis
In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random vari...
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| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2011
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/91582 http://hdl.handle.net/10220/6705 |
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| Institution: | Nanyang Technological University |
| Language: | English |