Wavelet analysis of speckle patterns with a temporal carrier

A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of sp...

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Bibliographic Details
Main Authors: Fu, Yu, Tay, Cho Jui, Quan, Chenggen, Miao, Hong
Other Authors: Temasek Laboratories
Format: Article
Language:English
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/92121
http://hdl.handle.net/10220/6468
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Institution: Nanyang Technological University
Language: English