Wavelet analysis of speckle patterns with a temporal carrier
A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of sp...
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| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2010
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/92121 http://hdl.handle.net/10220/6468 |
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| Institution: | Nanyang Technological University |
| Language: | English |
| Summary: | A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is
presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry,
one captures a series of speckle patterns, using a high-speed CCD camera. To avoid ambiguity in
phase estimation, a temporal carrier is generated by a piezoelectric transducer stage in the reference
beam of the interferometer. The intensity variation of each pixel on recorded images is then analyzed
along the time axis by a robust mathematical tool, i.e., a complex Morlet wavelet transform. After the
temporal carrier is removed, the absolute displacement of a vibrating object is obtained without the need
for temporal or spatial phase unwrapping. The results obtained by a wavelet transform are compared
with those from a temporal Fourier transform. |
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