Wavelet analysis of speckle patterns with a temporal carrier
A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of sp...
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Main Authors: | Fu, Yu, Tay, Cho Jui, Quan, Chenggen, Miao, Hong |
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其他作者: | Temasek Laboratories |
格式: | Article |
語言: | English |
出版: |
2010
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/92121 http://hdl.handle.net/10220/6468 |
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機構: | Nanyang Technological University |
語言: | English |
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